Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Assuring you our best, always

Benchtop ED-XRF Analyser
SPECTRO XEPOS

The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits — yielding remarkable gains in precision and accuracy.

The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.

Different versions maximize performance for selected elemental groups in specific matrices. An innovative X-ray tube and unique new adaptive excitation technology furnish the highest possible sensitivity, optimized to target elements of choice.

Key benefits
  • Outstanding sensitivity leads to up to a factor 3 improved precision – the basis for high accuracy when analyzing minor to major element concentrations
  • Measure lower than ever: Adaptive excitation, advanced tube design and high-count throughput detection system result in significantly (typically a factor 3) lower limits of detection for a wide range of elements
  • Master the unknown: The Turboquant II software tool provides an unprecedented ability to analyze unknown samples, regardless if they are liquid, solid or powder – whether tree leaves, plastics, oil, granite or glass.
Applications
  • Soils
  • Geological
  • Mining
  • Slag
  • Cement
  • ROHS compliance
  • Sewage
  • Soils
  • Waste
  • Alloys
  • Sludge
  • Oil analysis

Specs & Applications
  • Model:  SPECTRO XEPOS 5
  • Sample Position:  12 to 25 positions
  • Detector:  Ultra –high count rate Si-Drift Detector (SDD) with Peltier Cooling
  • Excitation System:  X-ray tube with thick binary Pd/Co alloy anode with air-cooling Max. power: 50 W, Max. voltage: 60 kV
  • Software:  XRF Analyzer Pro
Please contact us for more information