Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information

Benchtop ED-XRF Analyser
SPECTRO XEPOS

The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits — yielding remarkable gains in precision and accuracy.

The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.

Different versions maximize performance for selected elemental groups in specific matrices. An innovative X-ray tube and unique new adaptive excitation technology furnish the highest possible sensitivity, optimized to target elements of choice.

Key benefits
  • Outstanding sensitivity leads to up to a factor 3 improved precision – the basis for high accuracy when analyzing minor to major element concentrations
  • Measure lower than ever: Adaptive excitation, advanced tube design and high-count throughput detection system result in significantly (typically a factor 3) lower limits of detection for a wide range of elements
  • Master the unknown: The Turboquant II software tool provides an unprecedented ability to analyze unknown samples, regardless if they are liquid, solid or powder – whether tree leaves, plastics, oil, granite or glass.
Applications
  • Soils
  • Geological
  • Mining
  • Slag
  • Cement
  • ROHS compliance
  • Sewage
  • Soils
  • Waste
  • Alloys
  • Sludge
  • Oil analysis

Specs & Applications
  • Model:  SPECTRO XEPOS 5
  • Sample Position:  12 to 25 positions
  • Detector:  Ultra –high count rate Si-Drift Detector (SDD) with Peltier Cooling
  • Excitation System:  X-ray tube with thick binary Pd/Co alloy anode with air-cooling Max. power: 50 W, Max. voltage: 60 kV
  • Software:  XRF Analyzer Pro
Please contact us for more information