Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information

Electronics X-Ray Inspection
XT V 130C

The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130 kV/10 watt  Nikon Metrology manufactured source, a globally recognized open tube design with an integrated generator, and a high-resolution imaging chain.

Through a series of factory and field upgrades, the end-user can configure these systems to their own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology.

Key Benefits
  • Proprietary 30-130 kv micro-focus source with 2μm feature recognition
  • True 75° manipulator tilting angle allows oblique viewing for easy inspection of internal features
  • Large measurement area of 520x520 mm
  • Intuitive joystick navigation drives real-time X-ray imaging
  • Dual display for combined measurement and real-time analysis
  • Low cost of ownership and maintenance with open-tube technology
  • Safety as a design criterion
  • CT and X.Tract (laminography) ready
Specifications
  • Max kV: 130 kV
  • Max. electron beam power: 10 W
  • X-ray source: Open tube transmission target
  • Focal spot size: 3 µm1 (below 2 W) 1; rising to 10 µm at 10W
  • Defect recognition capability: 2 µm
  • Geometric magnification: 2.5x-2,400x
  • System magnification: Up to 36,000x
  • Imaging system: (Standard) 1.45 Mpixel 12-bit camera with 6" image intensifier
  • Manipulator: 4-axis (X, Y, Z, T)
  • Rotate axis: Optional
  • Tilt: 0 - 75 degrees
Please contact us for more information