Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Assuring you our best, always

Electronics X-Ray Inspection
XT V 130C

The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130 kV/10 watt  Nikon Metrology manufactured source, a globally recognized open tube design with an integrated generator, and a high-resolution imaging chain.

Through a series of factory and field upgrades, the end-user can configure these systems to their own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology.

Key Benefits
  • Proprietary 30-130 kv micro-focus source with 2μm feature recognition
  • True 75° manipulator tilting angle allows oblique viewing for easy inspection of internal features
  • Large measurement area of 520x520 mm
  • Intuitive joystick navigation drives real-time X-ray imaging
  • Dual display for combined measurement and real-time analysis
  • Low cost of ownership and maintenance with open-tube technology
  • Safety as a design criterion
  • CT and X.Tract (laminography) ready
Specifications
  • Max kV: 130 kV
  • Max. electron beam power: 10 W
  • X-ray source: Open tube transmission target
  • Focal spot size: 3 µm1 (below 2 W) 1; rising to 10 µm at 10W
  • Defect recognition capability: 2 µm
  • Geometric magnification: 2.5x-2,400x
  • System magnification: Up to 36,000x
  • Imaging system: (Standard) 1.45 Mpixel 12-bit camera with 6" image intensifier
  • Manipulator: 4-axis (X, Y, Z, T)
  • Rotate axis: Optional
  • Tilt: 0 - 75 degrees
Please contact us for more information