White Light Interferometric Microscopes High Pixel Resolution Model
BW-Series - Accurate sub-nano-surface profiler with non-contact measurement. Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to suit a wide range of measurement applications.
Key Benefits
Realizes 0.1 nm-level measurements of ultra-smooth surfaces with neither averaging nor filtering process
Enables measurement of both smooth and rough surfaces without changing measurement mode or optical filters
Wide range of observation methods
SiC Wafer: Sub-nano-level measurement in a wide range of magnification
Specifications
Measurement optical system: Focus Variation with White Light Interferometry (FVWLI)