Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information

1st Optical Inspection System 
WIS1000

WIS1000 Wafer Inspection system is designed to handle wafer for optical inspection, wafer mapping and defects classification management. The system is equipped with OCR Wafer ID Reader for wafer map retrieval from the host server. It is integrated with Nikon NWL 200 Wafer Auto-Loader and programmable XY indexing table for Macro and Micro inspection.
Specifications
  • Footprint: 1420 (L) x 943 (W) x 1622 (H) mm
  • Wafer carrier type: SEMI Standard Open Cassett e
  • Load Port: 1 Load Port
  • Power: 230VAC @ 13A 50Hz
Please contact us for more information