Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information

RoHS & ELV Analyser
EA1200VX

The EA1200VX High-Sensitivity Element Monitor supports a wide range of applications from RoHS/ELV compliance screening to advanced analysis. Equipped with a unique XRF detector, the Vortex, which features high resolution, sensitivity and count rate, the EA1200VX has remarkably improved overall sensitivity. Using the instrument in combination with the precision control software greatly shortens measurement time.

Key benefits
  • Phenomenal High-Speed Analysis (High Sensitivity)
  • High Count Rate Detector—No LN2 Needed
  • Time-Saving Uni Filter (Optional)
  • Micro Spot Analysis
Specs & Applications
  • Elements:  Atomic Number: 11 (Na) to 92 (u) * Atomic nos. when Vacuum Option
  • Sample type:  Solid, Powder, Liquid
  • X-ray tube:  Small Air-cooled X-ray tube (Rh target)
  • Voltage:  15kV, 30kV, 40kV, 50kV
  • Current:  1mA
  • Detector:  Vortex Si semiconductor detector (liquid nitrogen free)
  • Analysis area:  1mm, 8mm (automatic switching)
  • Chamber:  430(W)x320(D)x195(H)mm /  239(W)x280(D)x66(H)mm (vacuum)
  • Filters:  5 mode automatic switching (including OFF)
Please contact us for more information