Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information

Scanning Acoustic Microscope
VUE 400-P

Vue 400-P imaging power surpasses modern standards, delivering premium FA Lab features to semiconductor facilities.

Key Benefits
  • Real-time A-scan & B-scan & SLICE
  • A-scan Capture 
  • Frequency Domain Imaging (FFT)
  • Advanced Time-of-Flight & Thickness Measurements
  • C-scan with Multi-gate (SALI & SALI Groups)
  • Cluster Analysis (post-processing)
  • Threshold Mapping (post-processing) 
 ​Applications
  • Research & Development
  • Product Reliability
  • Product Inspection
  • Process Validation
  • Vendor Qualification
  • Quality Control
  • Failure Analysis
  • Counterfeit Detection
​​
Specifications
Motor: Servo on scan axis
Max Velocity: 1.0m/s
Accuracy: ±0.5µm
Resolution: 0.5µm
Stage Size: 350 x 330 x 50 mm
Please contact us for more information