Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information

X-ray & CT Inspection of Larger Samples
​XT H 320 

The XT H 320 features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320 kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to mini focus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.

With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span

Key Benefits
  • Proprietary 320 kV microfocus X-ray source
  • Run highly accurate inspection on dense industrial objects
  • Easy system operation and low cost-of-ownership
  • Stunning images providing great insight
  • High-performance image acquisition and volume processing
  • Straightforward inspection automation
  • Safety first
Applications
  • Fault detection and failure analysis
  • Assembly inspection of complex mechanisms
  • Dimensional measurement of internal components
  • Part-to-CAD comparison
  • Advanced material research
  • Analysis of the biological structures
  • Digital archiving of models

Specifications
  • Cabinet dimensions (LxWxH) 2695 mm x 1828 mm x 2249 mm
  • Weight 8,500 kg
  • Safety All systems are manufactured to IRR99
  • Control software  All systems are controlled by Nikon Metrology’s in-house Inspect-X software 
Please contact us for more information