Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information

XRF Coating Thickness Gauge
FT150

The latest development of FT150 is an optimal device for ultra-thin coatings of micro connectors, flexible boards and lead frames. It utilized a high luminance, 30µm diameter X-ray beam delivered bu poly-capillary optics. FT150h is a model capable of challenging coating thickness measurements including tin(Sn) and silver (Ag). The newly developed software offers improved operability and efficient data management.

Key benefits
  • High precision measurement at micro spots
  • Safe and easy to use
  • Enhanced visibility of measurement spots
  • New graphical user interfaces
Specs & Applications
  • Elements:  Atomic Number: 13(Al) to 92 (U)
  • Voltage:  45kV
  • Current:  1mA
  • Detector:  Vortex Si semiconductor detector (liquid nitrogen free)
  • X-ray Tube:  Focusing optics system: Poly Capillary;  Beam: 30µm (mo target)
  • Sample Observation:  SSD camera
  • Sample Image Focus:  Laser Pointer with autofocus
  • Filters:  Primary filter with automatic switching
Please contact us for more information