Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information

XRF Coating Thickness Gauge
FT9400

FT9400 series is a high-performance, high-powered X-ray tube and a dual detector (semiconductor detector and proportional counter) and responds to all coating thickness measurement needs, including thin film, alloy film and submicroscopic measurements. Can be also used for qualitative analysis of extraneous substances and elemental analysis, as well as coating thickness measurement.

Key benefits
  • Dual Detector
  • Thin Film FP Software can be used for a wide range of applications including alloy plating with lead-free solder and composite plating.
  • Round 15 µm collimator standard installed, effective for measuring coating thickness in microscopic areas.
  • Equipped with 75 W high-powered x-ray tube.
  • Can easily observe microscopic areas, equipped with four-step zoom.
  • Incident lighting makes samples easier to view
  • Collision prevention sensor makes contoured samples safe to use
  • High-accuracy stage drive train powered by servomotor
Specs & Applications
  • Elements: Atomic No. 22(Ti) to 83(Bi); Atomic No. 21 or less can be measured by the absorption method
  • X-ray source: Small Air-cooled high-power X-ray tube (Mo target, Be window)
  • Voltage: 50 kV
  • Current: 1.5 mA
  • Detector: Proportional Counter and Semiconductor Detector (No LN2required)
  • Sample Observation: CCD camera with optical zoom, halogen light
  • Filter: Primary filter: Mo, automatic switching 
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