Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information

XRF Coating Thickness Gauge
FT9500

Advanced X-ray microfocus technology has achieved high brilliance beam with an actual beam size of less than 0.1mm in diameter. Consequently, FT9500 series is capable of measurements of microspots and thin film applications, such as lead frames, connectors, and flexible PCB's that are difficult to measure with conventional models due to insufficient fluorescent X-ray intensify from measurement samples, also suitable for RoHS and ELV analysis.
Specs & Applications
  • Elements: Atomic Numbers 12(AI) to 83(Bi)
  • X-ray source: Small Air-cooled high-power X-ray tube (Mo target, Be window)
  • Voltage: 50 kV
  • Current: 1.5 mA
  • Detector: Semiconductor Detector (No LN2required)
  • Sample Observation: CCD camera with optical zoom, halogen light
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