Analytical Instruments
Arc Spark OES
ICP-OES Spectrometers
ED-XRF & XRF Spectrometer
Colour, Glow, Turbidity & Reflectometer
Handheld LIBS & XRF Analyser
Automatic Titrators & Resistivity Meters
Elemental Analyser
Karl Fisher Moisture Meter
Laboratory Consumables
Oil, Fuel & Fluid Analysis
Petroleum Testing Apparatus
RoHS & Elemental Analysis
Sample Preparation
Solar Energy Solutions
Thermal Analysis
UV-VIS Spectrophotometer
XRF Coating Thickness Gauge
Inspection, Test & Measurement Equipment
3D Scanning Metrology
3D Surface Profiler
Adhesive, Bonding, Scratch & Solder Wettability Tester
CNC Video Measuring Machine
Coordinate Measuring Machine
Industrial Microscopes
Real-time X-Ray & CT Inspection
Scanning Acoustic Microscope (SAM)
Wafer Geometry Gauge
Semiconductor Automated Handling Equipment
Wafer Batch ID Reading & Marking System
Wafer Packing & Unpacking System
Wafer Sorting System
Wafer Batch Transfer System
Material & Engineering Solutions
Production Equipment
Semiconductor Inspection & Handling Equipment
Optical Inspection System
Automated Optical Inspection System
Advanced Metrology System