Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Inverted Metallurgical Microscope
ECLIPSE MA200
Inverted Metallurgical Microscope
ECLIPSE MA100N
More Information
More Information
Assuring you our best, always

Manual Wafer Measurement Tools
MX 30x

Applications
  • R&D
  • In process control for ThicknessTTV

Specifications
  • Sensor:  Multiple point wafer geometry gauge
  • Wafer size:  Up to 450 mm
  • Thickness range:  From 50µm
  • Accuracy:  1µm
  • Resolution:  0.1µm
  • Loading:  With or without Robots Handling point
Please contact us for more information