RoHS & ELV Analyser – EA6000VX

  • The EA6000VX High-Sensitivity XRF Analyzer is capable of determining hazardous substances over entire surfaces as well as measuring microscopic points in a specified area; tasks that are not possible using conventional XRF instruments.


The EA6000VX enables challenging applications such as managing harmful substances over entire surface boards to the measurement of tiny parts. The high-speed mapping capability reveals information such as element distribution and thickness quickly. Combined with state-of-the-art Silicon drift detectors and high-resolution imaging capabilities, even minute foreign matter of several tens of um would not be missed detect in a wide area (250mm x200mm). Proprietary function from predecessor such as the auto approach, collision prevention enables EA6000VX to be easily operable. 


  • High-speed mapping
  • Continuous multi-point measurement
  • High-precision superimpose mapped images
  • Microscopic area coating thickness measurement
  • Light element from Na measurement with Helium purge option
  • Foreign matter detection
  • Safe and secure operation.
Tube target material Air cooled – Tungsten target, Rhodium target (optional)
Collimator 0.2, 0.5, 1.2, 3 mm Square (automatic switching)
Elements 11Na~92U
Primary filter 5 type, 6modes (automatic switching)
Measurement condition He purge (Optional) / Atmospheric
Detector Silicon Drift detector (Not requiring liquefied nitrogen)
Sample chamber (mm) 580(W) x 450(D) x 150(H) mm
Machine dimension (mm) 740(W) × 740(D) × 783(H) mm
Typical Scan area Any squared area 250 x 200 mm
Measurement time/pixel 1ms – 1s

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