Small spot energy dispersive X-ray fluorescence (ED-XRF) spectrometer enhanced for compliance testing, for element line scans and mappings

  • Fast and non-destructive compliance screening with flexible spot sizes, from 0.1 to 4 mm
  • Element line scans and mappings: Get a qualitative elemental composition within minutes ‒ other micro-XRF instruments may require hours
  • Comprehensive suite with factory-prepared calibrations for the screening of plastics and composites and analysis of alloys


The SPECTRO MIDEX includes a fast, non-destructive analysis of small spots and the rapid imaging of large areas (up to 233×160 mm, 9.2×6.3”) in research and development as well as in compliance screening applications. In industries such as research & development that needs non-destructive measuring system which are extremely sensitive and requires small measuring spot, SPECTRO MIDEX is your preferred choice.

Speed is also crucial together with ease of use of the equipment that could enable user to transfer results to lab network instantly. SPECTRO MIDEX has been providing users with first-class non-destructive XRF sampling results for years making it the most advanced mid-range benchtop XRF equipment for small point analysis and rapif mapping for large surfaces.

  • Analysis of jewellery and precious metal alloys
  • Analysis of small parts and detection of inclusions in the metal, aerospace and automotive industries
  • RoHS compliance screening of components and assemblies in the electronics industry

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