Our expertise in optics, electronics and software engineering goes hand-in-hand with our in-depth process knowledge. We offer our customers a competent and reliable partnership in all sectors: In industry, our products enable cost reduction, better efficiency and quality control; For OEM customers, LayTec's integrated metrology solutions feed smart data into control loops; For research institutions, our customized metrology enables innovation in new processes, materials and devices.
In-situ Metrology
- LayTec’s in-situ metrology enables the development of new thin-film processes, materials and structures. In established processes, it is a must for high yields and maximum uptimes.
- LayTec’s in-situ monitoring solutions are the most advanced on the market today. Our systems cover a complete range of thin-film applications, providing access to all significant thin film growth parameters.
At-line Metrology
- LayTec’s off-line equipment will save your time and money when used at-line in production or in your lab for quick and reliable estimation and quantification of certain product properties.
- Our lab-line tools are used for fast process optimization as well as for tests and product certification. We offer lab-line tools for the following applications:
In-line Metrology
- In-line metrology means fast, automated, reliable and non-destructive measurements that are fully integrated into a production line for comprehensive process control.
- LayTec’s in-line metrology systems are applied in the photovoltaics, OLED/OPV, display, touch panel and glass coating industries.
- Typically, our in-line metrology applies multi-optical head configuration with extremely high data acquisition. These metrology systems are integrated into the transfer systems between the processing steps.
- Our gold standard is 100% monitoring coverage of the thin film devices with zero delay of the manufacturing process.
