Equipment Software (SECS/GEM)
Comprehensive support for the SECS/GEM standards, enabling seamless communication and control between factory systems and manufacturing equipment.
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Analytical Instruments
- Arc Spark OES
- Automated Sample Preparation
- Automatic Titrators & Resistivity Meters
- Colour, Turbidity & Reflectometer
- ED-XRF & XRF Spectrometer
- Electric Fusion Fluxer
- Elemental Analysis Instruments
- Elemental CHNS-O Analyser
- Glow Discharge Spectrometer GDOES
- Handheld LIBS & XRF Analyser
- ICP-OES Spectrometers
- Karl Fisher Moisture Meter
- Laboratory Consumables
- Laboratory Shakers
- Lubrication Testing Equipment
- Oil, Fuel, and Fluid Analysis
- Petroleum Testing Apparatus
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Inspection, Test & Measurement Equipment​
Material & Engineering Solutions
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Smart Automation Solutions
Semiconductor Inspection & Handling​
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Automotive
Electrical & Electronics
- 3D Scanning Metrology
- 3D Surface Profiler
- CNC Video Measuring Machine
- Glow Discharge Spectrometer GDOES
- ICP-OES Spectrometers
- Industrial Microscopes
- Real-time X-Ray & CT Inspection
- Scanning Acoustic Microscope (SAM)
- Surface Analysis Testers
- Thermal Analysis
- UV and UV-Vis Spectrophotometers
- XRF Coating Thickness Gauge
Academia & Research
Environmental
- Arc Spark OES
- Automatic Titrators & Resistivity Meters
- Colour, Glow, Turbidity & Reflectometer
- ED-XRF & XRF Spectrometer
- Elemental Analysis Instruments
- Elemental CHNS-O Analyser
- Glow Discharge Spectrometer GDOES
- Handheld LIBS & XRF Analyser
- ICP-OES Spectrometers
- Karl Fisher Moisture Meter
- Laboratory Consumables
- Laboratory Shakers
- RoHS Compliance Analysis
- 3D Surface Profiler
- Die Sorter & Die Bonder
- Equipment Software (SECS/GEM)
- Plasma Cleaning & Etching System
- Regenerative Thermal Oxidizer (RTO)
- Scanning Acoustic Microscope (SAM)
- Semiconductor Elemental Analysis
- Semiconductor Molding Machines
- Surface Analysis Testers
- Thermal Analysis
- Probe Station Solutions
- Wafer Geometry Gauge
- Wafer Probers & Probe Cards
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