QES to Exhibit at SEMICON China 2025 – Showcasing Wafer Surface Measurement Innovation

QES successfully concluded our participation at SEMICON China 2025, held from 26 – 28 March 2025 at the Shanghai New International Expo Centre (SNIEC), China. As one of the most influential semiconductor industry events in Asia, SEMICON China provided an exceptional platform for us to connect with global industry leaders and demonstrate our latest innovations.

At this year’s exhibition, we proudly showcased the Wafer Surface Measurement System – WSM1300, a high-precision solution engineered for non-contact surface characterization of semiconductor wafers.

Key Highlights from Our Booth

🔹 Live demonstrations of the WSM1300 attracted strong interest, with visitors experiencing its advanced capabilities in wafer flatness, roughness, and defect detection.
🔹 Our team engaged in meaningful conversations with semiconductor manufacturers, R&D professionals, and technology partners about how WSM1300 can optimize production processes and improve yield.
🔹 We also highlighted our broader portfolio of metrology and inspection systems tailored to meet the growing demands of semiconductor fabrication.

A Strategic Presence in a Growing Market

As China continues to advance its domestic semiconductor capabilities, SEMICON China 2025 was a timely opportunity for QES to strengthen regional partnerships, stay attuned to market needs, and reaffirm our commitment to delivering cutting-edge precision solutions.

We extend our heartfelt thanks to all who visited us during the event. Your support and engagement made our experience at SEMICON China 2025 a tremendous success.

Stay tuned as we continue to drive innovation in semiconductor metrology and prepare for more global exhibitions ahead!

Date: 26 – 28 March 2025

Venue: SNIEC, Shanghai, China