Date: 24th – 27th June 2017 Venue: Macau, Hong Kong
Date: 5th – 7th May 2017 Venue: Pulau Langkawi, Kedah, Malaysia
Date: 18th March 2017 Venue: Padang DBKL, Kuala Lumpur, Malaysia. Organized by: Pusat Jagaan & Latihan Insan Istimewa
- About
- By Applications
Analytical Instruments
- Arc Spark OES
- Automated Sample Preparation
- Automatic Titrators & Resistivity Meters
- Colour, Turbidity & Reflectometer
- ED-XRF & XRF Spectrometer
- Electric Fusion Fluxer
- Elemental Analysis Instruments
- Elemental CHNS-O Analyser
- Glow Discharge Spectrometer GDOES
- Handheld LIBS & XRF Analyser
- ICP-OES Spectrometers
- Karl Fisher Moisture Meter
- Laboratory Consumables
- Laboratory Shakers
- Lubrication Testing Equipment
- Oil, Fuel, and Fluid Analysis
- Petroleum Testing Apparatus
- Solar Energy Solutions
- Thermal Analysis
Inspection, Test & Measurement Equipment
Material & Engineering Solutions
Production Equipment
Smart Automation Solutions
Semiconductor Inspection & Handling
- By Industry
Automotive
Electrical & Electronics
- 3D Scanning Metrology
- 3D Surface Profiler
- CNC Video Measuring Machine
- Glow Discharge Spectrometer GDOES
- ICP-OES Spectrometers
- Industrial Microscopes
- Real-time X-Ray & CT Inspection
- Scanning Acoustic Microscope (SAM)
- Surface Analysis Testers
- Thermal Analysis
- UV and UV-Vis Spectrophotometers
- XRF Coating Thickness Gauge
Academia & Research
Environmental
- Arc Spark OES
- Automatic Titrators & Resistivity Meters
- Colour, Glow, Turbidity & Reflectometer
- ED-XRF & XRF Spectrometer
- Elemental Analysis Instruments
- Elemental CHNS-O Analyser
- Glow Discharge Spectrometer GDOES
- Handheld LIBS & XRF Analyser
- ICP-OES Spectrometers
- Karl Fisher Moisture Meter
- Laboratory Consumables
- Laboratory Shakers
- RoHS Compliance Analysis
- 3D Surface Profiler
- Die Sorter & Die Bonder
- Equipment Software (SECS/GEM)
- Plasma Cleaning & Etching System
- Regenerative Thermal Oxidizer (RTO)
- Scanning Acoustic Microscope (SAM)
- Semiconductor Elemental Analysis
- Semiconductor Molding Machines
- Surface Analysis Testers
- Thermal Analysis
- Probe Station Solutions
- Wafer Geometry Gauge
- Wafer Probers & Probe Cards
- By Brands
E+H Metrology
EKO Instruments
Einnosys
EuroVector
Environmental Express (Katanax)
HERZOG Maschinenfabrik
Hitachi High-Tech
I-PEX
Leybold
LK Metrology
Lubrication Plus
MAT Plus
Nikon Metrology
Nippon Denshoku
Nittoseiko Analytech
OKOS
OMRON
Rhesca
Rigaku
SaulTech
SCP Science
SciAps
SCI Plasma
Semishare
Sensofar Metrology
SPECTRO Analytical
Spectro Scientific
Spectruma Analytik
Tanaka Sci
Taitec
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