FT160 series is perfect for high precision, high throughput at nano-order level plating applied to minute electronic components. The FT160 carries a polycapillary optic system for a Ф30µm high-intensity primary X-ray beam (FWHM@17µm) paired with a high-performance semiconductor detector (SDD). The increased primary filter selection allows better performance control on the FT160 series, fulfilling even wider application scope such as ENIG, ENEPIG coating thickness measurement. All FT160 models feature an HD camera and annular illumination to deliver optimal pinpoint positioning and lighting conditions. The new designed software that emphasis on user-friendliness is very capable to handle challenging coating thickness applications including gold (Au), silver (Ag), Tin (Sn) and electroness-Nickel (Ni-P).