Description
FT160 series is perfect for high precision, high throughput at nano-order level plating applied to minute electronic components. The FT160 carries a polycapillary optic system for a Ф30µm high-intensity primary X-ray beam (FWHM@17µm) paired with a high-performance semiconductor detector (SDD). The increased primary filter selection allows better performance control on the FT160 series, fulfilling even wider application scope such as ENIG, ENEPIG coating thickness measurement. All FT160 models feature an HD camera and annular illumination to deliver optimal pinpoint positioning and lighting conditions. The new designed software that emphasis on user-friendliness is very capable to handle challenging coating thickness applications including gold (Au), silver (Ag), Tin (Sn) and electroness-Nickel (Ni-P).
- High precision measurement at micro spots
- Wide chassis options to accommodate different sample size and applications
- Increased primary filters selections
- Enhanced visibility of measurement spots
- Machine learning capability ready for measurement automation
- Simple software for better usability
Specifications
Type | FT160S | FT160Sh | FT160 | FT160h | FT160L | FT160Lh | ||
Xray Source | Mo | W | Mo | W | Mo | W | ||
Elements | Atomic No. 13(Al) to 92(U) | |||||||
Tube Voltage | 45 kV | |||||||
Detector | Vortex Silicon Drift Detector,SDD (No LN2 required) | |||||||
X-ray focusing | Polycapillary | |||||||
Sample stage (mm) | 300(W)x245(D) | 420(W)x320(D) | 620(W)x620(D) | |||||
Max Sample Size (mm) | 300(W)x245(D)x80(H) | 400(W)x300(D)x100(H) | 600(W)x600(D)x20(H) | |||||
Sample Observation | CCD camera (1 million pixels) | |||||||
FT160 series is perfect for high precision, high throughput at nano-order level plating applied to minute electronic components. The FT160 carries a polycapillary optic system for a Ф30µm high-intensity primary X-ray beam (FWHM@17µm) paired with a high-performance semiconductor detector (SDD). The increased primary filter selection allows better performance control on the FT160 series, fulfilling even wider application scope such as ENIG, ENEPIG coating thickness measurement. All FT160 models feature an HD camera and annular illumination to deliver optimal pinpoint positioning and lighting conditions. The new designed software that emphasis on user-friendliness is very capable to handle challenging coating thickness applications including gold (Au), silver (Ag), Tin (Sn) and electroness-Nickel (Ni-P).
- High precision measurement at micro spots
- Wide chassis options to accommodate different sample size and applications
- Increased primary filters selections
- Enhanced visibility of measurement spots
- Machine learning capability ready for measurement automation
- Simple software for better usability
