XRF Coating Thickness Gauge – FT 160 Series

  • Precisely measures 50 nm Au coating thickness in 10 seconds
  • High precision measurement at micro spots
  • Wide chassis options to accommodate different sample size and applications
  • Increased primary filters selections

Description

FT160 series is perfect for high precision, high throughput at nano-order level plating applied to minute electronic components. The FT160 carries a polycapillary optic system for a 30µmФ high intensity primary X-ray beam (FWHM@17µm) paired with a high performance semiconductor detector (SDD).
 
This series also features HD camera and annular illumination to deliver optimal pinpoint positioning and lighting conditions. The new designed software that emphasis on user-friendliness is very capable to handle challenging coating thickness applications including gold (Au), silver (Ag), Tin (Sn) and electroness-Nickel (Ni-P).

Key Benefits
  • High precision measurement at micro spots
  • Wide chassis options to accommodate different sample size and applications
  • Increased primary filters selections
  • Enhanced visibility of measurement spots
  • Machine learning capability ready for measurement automation
  • Simple software for better usability

Specifications

Model

FT160S

FT160Sh

FT160

FT160h

FT160L

FT160Lh

X-ray source

Standard

High-energy

Standard

High-energy

Standard

High-energy

Mo

W

Mo

W

Mo

W

Elements

Atomic No. 13(Al) to 92(U)

Sample stage (mm)

300(W) × 245(D)

420(W) × 320(D)

620(W) × 620(D)

Maximum sample size (mm)

300(X) × 245(Y) × 80(Z)

400(X) × 300(Y) × 100(Z)

600(X) × 600(Y) × 20(Z)

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