XRF Coating Thickness Gauge – FT 160 Series

  • Precisely measures 50 nm Au coating thickness in 10 seconds
  • High precision measurement at micro spots
  • Wide chassis options to accommodate different sample size and applications
  • Increased primary filters selections

Description

FT160 series is perfect for high precision, high throughput at nano-order level plating applied to minute electronic components. The FT160 carries a polycapillary optic system for a Ф30µm high-intensity primary X-ray beam (FWHM@17µm) paired with a high-performance semiconductor detector (SDD). The increased primary filter selection allows better performance control on the FT160 series, fulfilling even wider application scope such as ENIG, ENEPIG coating thickness measurement. All FT160 models feature an HD camera and annular illumination to deliver optimal pinpoint positioning and lighting conditions. The new designed software that emphasis on user-friendliness is very capable to handle challenging coating thickness applications including gold (Au), silver (Ag), Tin (Sn) and electroness-Nickel (Ni-P).

Key Benefits
  • High precision measurement at micro spots
  • Wide chassis options to accommodate different sample size and applications
  • Increased primary filters selections
  • Enhanced visibility of measurement spots
  • Machine learning capability ready for measurement automation
  • Simple software for better usability

Specifications

Type

FT160S

FT160Sh

FT160

FT160h

FT160L

FT160Lh

Xray Source

Mo

W

Mo

W

Mo

W

Elements

Atomic No. 13(Al) to 92(U)

Tube Voltage

45 kV

Detector

Vortex Silicon Drift Detector,SDD (No LN2 required)

X-ray focusing

Polycapillary

Sample stage (mm)

300(W)x245(D)

420(W)x320(D)

620(W)x620(D)

Max Sample Size (mm)

300(W)x245(D)x80(H)

400(W)x300(D)x100(H)

600(W)x600(D)x20(H)

Sample Observation

CCD camera (1 million pixels)

Work with the best integrated solution provider

About Company

Subscribe Newsletter

2021 @ QES GROUP OF COMPANIES (201401042911)