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Semiconductor
QES delivers a complete portfolio of inspection, metrology, analysis, and handling equipment supporting both FEOL (Front-End of Line) and BEOL (Back-End of Line) semiconductor manufacturing. From wafer surface analysis and geometry measurement to packaging inspection and automated handling, our solutions help fabs, OSATs, and R&D labs improve yield, reduce process variation, and ensure product reliability.
Showing 1–32 of 158 results

1st Optical Inspection System – WIS1000
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1st Optical Inspection System – WIS1100
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1st Optical Inspection System – WIS8000
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2nd Optical Inspection System – DIS8000
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3rd Optical Inspection System – ISP3100
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4th Optical Inspection System – MPI3000
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Active Magnetic Field Canceller AMC-331
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Active Vibration Isolation Table for Electron Microscope
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Auto-molding Machine GP-PRO sf Series
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Auto-molding Machine GP-PRO SP-G Series
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Automated Barcode Printing and Labelling System – WID8000
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Automated Post Mold Inspection System – PMI2000
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Automated Post Mold Inspection System – PMI3000
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Basics Manual Probe Station – M Series
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Contactless One-Point Wafer Resistivity or Sheet Resistance – Mx 60 Series
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Contactless One-Point Wafer Thickness Gauge – MX 30x Series
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Contactless Wafer Geometry Gauge – MX 20x Series
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Desk Type Vibration Isolation Table DHS / DAS
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Desktop Active Vibration Isolation Table δTA
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Digital Sight Microscopy Camera – DS-Fi3
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Digital Sight Microscopy Camera – DS-Qi2
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Digital Sight Microscopy Camera – DS-Ri2
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Economical Manual Probe Station – E Series 150mm
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