Benchtop ED-XRF Analyser – SPECTRO XEPOS

An elemental analyzer designed for demanding applications – the SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer redefines XRF analysis with exceptional new levels of performance

  • Outstanding sensitivity leads to up to a factor 3 improved precision – the basis for high accuracy when analyzing minor to major element concentrations
  • Measure lower than ever: Adaptive excitation, advanced tube design and high-count throughput detection system result in significantly (typically a factor 3) lower limits of detection for a wide range of elements
  • Master the unknown: The Turboquant II software tool provides an unprecedented ability to analyze unknown samples, regardless if they are liquid, solid or powder – whether tree leaves, plastics, oil, granite or glass…

Description

The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It offers groundbreaking advances in the multi-element analysis of major, minor and trace element concentrations. New developments in excitation and detection provide outstanding sensitivity and detection limits – and thus a remarkable gain in precision and accuracy.

The SPECTRO XEPOS is ideally suited for critical tasks, from rapid screening analysis to precise quality control of products. The SPECTRO XEPOS is used in a wide range of industries, in geology and mining, in environmental and waste monitoring as well as in research and science. Different versions maximize performance for selected element groups in specific matrices.

An innovative X-ray tube and unique new adaptive excitation technology provide the highest possible sensitivity, optimized for the target elements of choice.

Applications
  • Soils
  • Geological
  • Mining
  • Slag
  • Cement
  • ROHS compliance
  • Sewage
  • Soils
  • Waste
  • Alloys
  • Sludge
  • Oil analysis
  •  
Specs & Applications
  • Model: SPECTRO XEPOS 5
  • Sample Position: 12 to 25 positions
  • Detector: Ultra –high count rate Si-Drift Detector (SDD) with Peltier Cooling
  • Excitation System: X-ray tube with thick binary Pd/Co alloy anode with air-cooling Max. : 50 W, Max. : 60
  • Software: XRF Analyzer Pro

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