Large Area 3D Profiler – S Wide

  • Sub-micron height repeatability over entire extended area
  • One-shot height measurement up to 40 mm without Z scanning
  • Bi-telecentric lenses with very low field distortion providing accurate metrology

Description

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high-resolution measuring instrument. Extremely easy-to-use with one single button acquisition.

Calibration of surface texture measuring instruments

All our systems are manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards following the ISO 25178 guidelines of part 7 for Z amplification factor, XY lateral dimensions, flatness error, as well as parcentricity and parfocality.

Applications

  • Advanced manufacturing
  • Archaeology & Paleontology
  • Consumer electronics
  • Medical devices
  • Molding
  • Optics
  • Watch industry

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