Scanning Acoustic Microscopy – VUE 400-P NEXGEN

  • Vue 400-P imaging power surpasses modern standards, delivering premium FA Lab features to semiconductor facilities.

Description

VUE 400-P imaging power surpasses modern standards delivering premium FA Lab features to semiconductor fabrication facilities. ODIS is the latest Acoustic Microscopy software with rich technical content built on current platforms and industry feedback. Advanced analysis is provided through quantitative tools for the measurement and classification of parts.

Key Benefits
  • Real-time A-scan & B-scan & SLICE
  • A-scan Capture 
  • Frequency Domain Imaging (FFT)
  • Advanced Time-of-Flight & Thickness Measurements
  • C-scan with Multi-gate (SALI & SALI Groups)
  • Cluster Analysis (post-processing)
  • Threshold Mapping (post-processing) 

Applications

  • Research & Development
  • Product Reliability
  • Product Inspection
  • Process Validation
  • Vendor Qualification
  • Quality Control
  • Failure Analysis
  • Counterfeit Detection
Specifications
 
  • Motor: Servo on scan axis
  • Max Velocity: 1.0m/s
  • Accuracy: ±0.5µm
  • Resolution: 0.5µm
  • Stage Size: 350 x 330 x 50 mm

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