Description
A series is SEMISHARE years carefully developed a production automatic high and low temperature probe, the probe station has high test precision and super-fast test speed, with automatic up-down material, automatic wafer alignment, automatic wafer center, automatic test diesize, etc, has the identification function of wafer ID at the same time, can be a single point test can also be continuous testing, test software feature-rich, heavily for the enterprise to gain test speed, greatly improving the productivity and efficiency.
Application direction
Wafer testing of various kinds of devices Wafer and other Wafer performed RF testing and other characteristics analysis of I-V C-V optical signal RF 1/ F noise, etc.
Application direction
Wafer testing of various kinds of devices Wafer and other Wafer performed RF testing and other characteristics analysis of I-V C-V optical signal RF 1/ F noise, etc.
Benefits Of A Series
- High precision and test speed, greatly improving test efficiency
- Micron-scale fully closed-loop motion control
- High voltage and high current test application
- Bernoulli arm support sheet
- Small size, light weight, smaller footprint
- 24X7 hours on-chip detection
Technical Specifications
- Working Environment: Open type
- Electricity demand: 220V, 50/60Hz
- Control Method: Fully automatic
- Product Size: 1124 x 1111 x 925
- Equipment Weight: 1.2 tonnes
Software Specifications
- Independently developed for stronger capability and richer functionalities
- Powerful wafer map editing feature, supporting offline and file import/export capabilities
- PMI needle mark detection function
- Wafer alignment function
- Needle alignment function
- Independent management of device, configuration and utility parameters
- High-resolution and high-precision temperature control
- Various accuracy compensation algorithm
- 32-bit BIN splitting function
- Supports testing machine communication protocols such as GPIB, TCP/IP, etc.
- Supports SECS/GEM communication protocol to meet factory MES communication requirements
- Wafer ID recognition function, supporting special characters such as dots,slashes and dashes
- High-speed autofocus function for images
- Support for different needle card Multi-site Location, etc.
