Description
A series is SEMISHARE years carefully developed a production automatic high and low temperature probe, the probe station has high test precision and super-fast test speed, with automatic up-down material, automatic wafer alignment, automatic wafer center, automatic test diesize, etc, has the identification function of wafer ID at the same time, can be a single point test can also be continuous testing, test software feature-rich, heavily for the enterprise to gain test speed, greatly improving the productivity and efficiency.
Application direction
Wafer testing of various kinds of devices Wafer and other Wafer performed RF testing and other characteristics analysis of I-V C-V optical signal RF 1/ F noise, etc.
Application direction
Wafer testing of various kinds of devices Wafer and other Wafer performed RF testing and other characteristics analysis of I-V C-V optical signal RF 1/ F noise, etc.
Benefits Of A Series
- Super high-test precision and test speed, greatly improve productivity benefits.
- Fully automated system running, fast safe and reliable test.
- Support single point testing and continuous testing.
- Integrated control system, fast access to instrument testing.
- CHUCK efficient test system, running speed exceeding 300mm/s.
- Rich software automation test, precise mechanical precision calibration.
- Automatic wafer thickness measurement and ID reading card can be upgraded.
- Leading internal anti – shock system device, more stable operation.
Technical Specifications
- Working Environment: Open type
- Electricity demand: 220V, 50/60Hz
- Control Method: Fully automatic
- Product Size: 1600 X 1660 X 1450
- Equipment Weight: 2.0 tonnes
Software Specifications
- Independently developed for stronger capability and richer functionalities
- Powerful wafer map editing feature, supporting offline and file import/export capabilities
- PMI needle mark detection function
- Wafer alignment function
- Needle alignment function
- Independent management of device, configuration and utility parameters
- High-resolution and high-precision temperature control
- Various accuracy compensation algorithm
- 32-bit BIN splitting function
- Supports testing machine communication protocols such as GPIB, TCP/IP, etc.
- Supports SECS/GEM communication protocol to meet factory MES communication requirements
- Wafer ID recognition function, supporting special characters such as dots,slashes and dashes
- High-speed autofocus function for images
- Support for different needle card Multi-site Location, etc.
