Arc Spark OES Analyser – SPECTROLAB S

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SPECTROLAB S – A True Revolution in High-End Metal Analysis

  • Highly accurate results in under 20 seconds (example: low-alloy steels)
  • Regular maintenance intervention requirements (spark stand cleaning) reduced by a factor of 8
  • On average factor 2 improvement in detection limits for low-alloy steels and a factor 5 improvement for pure aluminum metals versus previous models
  • Instrument footprint reduced by 27%
  • iCAL 2.0 — one sample standardization for the complete system, saving 30 minutes a day

Description

The SPECTROLAB S has the world’s 1st CMOS-based detector system that’s formed for high-end metal analysis — due to SPECTRO’s proprietary CMOS+T technology. (See next page.) From trace components to multimatrix applications, it provides very quick, extremely correct, exceptionally versatile analysis.

SPECTROLAB S regular maintenance intervention necessities (spark stand cleaning) are reduced by an element of eight. to boot, the system eliminates most standardization delays. thus analysis (and so production) continues uninterruptedly: sample once sample, day once day.
Many testing periods need solely a single-sample, 5-minute standardization. distinctive iCAL two.0 nosology will sometimes guarantee stable performance from then on — despite most shifts in close temperature or pressure! Most users save a minimum of half-hour daily.
When it involves sample output, SPECTROLAB S meets the metal market’s would like for speed. Example: once analyzing low steel, it will deliver extremely correct measurements in but twenty seconds!

To fit packed laboratory areas, the SPECTROLAB S analyser options a twenty seventh footprint reduction from previous models. Conveniences embrace AN easy-reach start/stop button and glued perform keys; a spark indicator light; noise minimisation construction; and fast access for spark stand cleansing or tool-free air cleaner changes while not gap the most instrument housing.

Applications

  • Metal manufacturing
  • Metal processing
  • Analysis of precious metals
  • Detection and Analysis of Inclusions
  • Automotive
  • Electronic Goods
  • ​Semiconductor

Key Features

  • Highly accurate results in under 20 seconds (example: low-alloy steels)
  • Regular maintenance intervention requirements (spark stand cleaning) reduced by a factor of 8
  • On average factor 2 improvement in detection limits for low-alloy steels and a factor 5 improvement for pure aluminum metals versus previous models
  • Instrument footprint reduced by 27%
  • iCAL 2.0 — one sample standardization for the complete system, saving 30 minutes a day

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