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Inspection, Test & Measurement Equipment
Showing 33–64 of 64 results

Pneumatic Active Vibration Isolation Unit
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Scanning Acoustic Microscopy – MACROVUE-P
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Scanning Acoustic Microscopy – VUE 250-P NEXGEN
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Scanning Acoustic Microscopy – VUE 400-P NEXGEN
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Scanning Electron Microscope – JEOL NeoScope JCM-7000
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Semiconductor Microscopes – Eclipse L200N Series
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Semiconductor Microscopes – Eclipse L300N Series
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Semiconductor Microscopes – NWL200 Wafer Loader
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Stereo Microscopes – SMZ1270
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Stereo Microscopes – SMZ1270i
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Stereo Microscopes – SMZ25/SMZ18
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Stereo Microscopes – SMZ445 & SMZ460
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Stereo Microscopes – SMZ745 & SMZ745T
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Stereo Microscopes – SMZ800N
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Upright Microscopes – Eclipse E200POL
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Upright Microscopes – Eclipse LV100N POL
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Upright Microscopes – Eclipse LV100ND
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Upright Microscopes – Eclipse LV100NDA
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Upright Microscopes – Eclipse LV150N
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Upright Microscopes – Eclipse LV150NA
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Upright Microscopes – Eclipse LV150NL
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